Texas Instruments 논리-특수 논리
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카테고리반도체 / 로직 IC / 논리-특수 논리
제조업체
기록 422
페이지 10/15
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부품 번호 |
제조업체 |
설명 |
재고 있음 |
수량 |
시리즈 | 논리 유형 | 공급 전압 | 비트 수 | 작동 온도 | 장착 유형 | 패키지 / 케이스 | 공급자 장치 패키지 |
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Texas Instruments |
IC 25BIT CONFIG REG BUFF 96-BGA |
7,758 |
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- | 1:1, 1:2 Configurable Registered Buffer | 1.7V ~ 1.9V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC OSCILLATOR DRIVER 8-DSBGA |
6,966 |
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74LVC | Crystal Oscillator Driver | 1.65V ~ 5.5V | 1 | -40°C ~ 85°C | Surface Mount | 8-XFBGA, DSBGA | 8-DSBGA, 8-WCSP (1.9x0.9) |
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Texas Instruments |
IC IEEE STD 1284 TXRX 48-TVSOP |
6,408 |
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74LVCE | IEEE STD 1284 Translation Transceiver | 3V ~ 3.6V | 19 | 0°C ~ 70°C | Surface Mount | 48-TFSOP (0.173", 4.40mm Width) | 48-TVSOP |
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Texas Instruments |
IC 25BIT CONFIG REG BUFF 96LFBGA |
3,312 |
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- | 1:1, 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-LFBGA (13.5x5.5) |
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Texas Instruments |
IC 25BIT CONFIG REG BUFF 96-BGA |
6,354 |
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- | 1:1, 1:2 Configurable Registered Buffer with Parity | 1.7V ~ 1.9V | 25, 14 | 0°C ~ 70°C | Surface Mount | 96-LFBGA | 96-PBGA MICROSTAR (13.6x5.6) |
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Texas Instruments |
IC REG BUFFER 13-26BIT 56-VQFN |
287 |
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74SSTVF | Registered Buffer with SSTL_2 Compatible I/O for DDR | 2.3V ~ 2.7V | 13, 26 | 0°C ~ 70°C | Surface Mount | 56-VFQFN Exposed Pad | 56-VQFN (8x8) |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
5,652 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
7,380 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
4,464 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24-SOIC |
7,776 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24DIP |
1,878 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC ARITHMETIC LOGIC UNIT 24DIP |
7,974 |
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74AS | Arithmetic Logic Unit | 4.5V ~ 5.5V | - | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC DECODER MEM DUAL 2-4 20-SOIC |
6,948 |
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74BCT | Memory Decoder | 4.5V ~ 5.5V | - | 0°C ~ 75°C | Surface Mount | 20-SOIC (0.295", 7.50mm Width) | 20-SOIC |
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Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
7,434 |
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74BCT | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TRANSCEIVER 1-9BIT 24SOIC |
8,964 |
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74BCT | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC TRANSCEIVER 1-9BIT 24DIP |
2,902 |
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74BCT | 8-Bit to 9-Bit Parity Bus Transceiver | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
3,240 |
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74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
8,874 |
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74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
7,362 |
|
74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
4,788 |
|
74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
3,472 |
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74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
5,850 |
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74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
5,940 |
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74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
776 |
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74BCT | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
5,148 |
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74BCT | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
5,832 |
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74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
8,028 |
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74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24-DIP |
6,696 |
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74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
7,290 |
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74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
2,952 |
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74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |