논리-특수 논리
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카테고리반도체 / 로직 IC / 논리-특수 논리
기록 1,366
페이지 29/46
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수량 |
시리즈 | 논리 유형 | 공급 전압 | 비트 수 | 작동 온도 | 장착 유형 | 패키지 / 케이스 | 공급자 장치 패키지 |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
8,874 |
|
74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
7,362 |
|
74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
4,788 |
|
74BCT | Scan Test Device with Inverting Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-SOIC |
3,472 |
|
74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
5,850 |
|
74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE BUFF 24-DIP |
5,940 |
|
74BCT | Scan Test Device with Buffers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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|
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
776 |
|
74BCT | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
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|
Texas Instruments |
IC SCAN TEST DEVICE TXRX 24-DIP |
5,148 |
|
74BCT | Scan Test Device with Bus Transceivers | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
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Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
5,832 |
|
74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
|
|
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24SOIC |
8,028 |
|
74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
|
|
Texas Instruments |
IC SCAN TEST DEVICE LATCH 24-DIP |
6,696 |
|
74BCT | Scan Test Device with D-Type Latches | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
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|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
7,290 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
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|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-SOIC |
2,952 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 24-SOIC (0.295", 7.50mm Width) | 24-SOIC |
|
|
|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
8,532 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
|
|
Texas Instruments |
IC SCAN TEST DEVICE W/FF 24-DIP |
3,996 |
|
74BCT | Scan Test Device with D-Type Edge-Triggered Flip-Flops | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Through Hole | 24-DIP (0.300", 7.62mm) | 24-PDIP |
|
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|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16-SOIC |
4,410 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.154", 3.90mm Width) | 16-SOIC |
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|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16SO |
5,958 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO |
|
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|
Texas Instruments |
IC FULL ADDER 4BIT BIN 16SO |
3,348 |
|
74F | Binary Full Adder with Fast Carry | 4.5V ~ 5.5V | 4 | 0°C ~ 70°C | Surface Mount | 16-SOIC (0.209", 5.30mm Width) | 16-SO |
|
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|
Texas Instruments |
IC TXRX ADDRESS/DATA 9BIT 52-QFP |
1,332 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 9 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
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|
Texas Instruments |
IC TXRX ADDRESS/DATA 9BIT 52-QFP |
6,660 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 9 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
|
Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
4,428 |
|
74FB | TTL/BTL Registered Transceiver | 4.75V ~ 5.25V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
|
Texas Instruments |
IC REGISTERED TXRX 8BIT 52-QFP |
5,184 |
|
74FB | TTL/BTL Registered Transceiver | 4.75V ~ 5.25V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
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|
Texas Instruments |
IC TXRX 8BIT TTL/BTL 52-QFP |
7,110 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
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|
Texas Instruments |
IC TXRX 8BIT TTL/BTL 52-QFP |
4,680 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 8 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
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|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
48 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
3,490 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
|
Texas Instruments |
IC TXRX 7BIT TTL/BTL 52-QFP |
2,466 |
|
74FB | TTL/BTL Transceiver/Translator | 4.5V ~ 5.5V | 7 | 0°C ~ 70°C | Surface Mount | 52-QFP | 52-QFP (10x10) |
|
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
8,856 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
4,896 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |
|
|
|
Texas Instruments |
IC TXRX ADJ EDGE 8BIT 56BGA |
8,442 |
|
74GTLP | LVTTL-TO-GTLP Adjustable-Edge-Rate Registered Transceiver | 3.15V ~ 3.45V | 8 | -40°C ~ 85°C | Surface Mount | 56-VFBGA | 56-BGA MICROSTAR JUNIOR (7.0x4.5) |